IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society

Published by IEEE

United States · Semiconductor materials and devices

Journal at a glance

ISSN

1530-4388, 1558-2574 (electronic)

Publisher

IEEE

Country

United States

Language

en

Also known as: IEEE Trans Device Mater Reliab (Abbreviation), IEEE transactions on device and materials reliability (Alternate title), Institute of Electrical and Electronics Engineers transactions on device and materials reliability (Alternate title), T-DMR (Alternate title), Institute of Electrical and Electronics Engineers transactions on device and material reliability (Alternate title), Device and materials reliability, IEEE transactions on (Alternate title)

Metrics

Subjects

• Semiconductor materials and devices
• Advancements in Semiconductor Devices and Circuit Design
• Integrated Circuits and Semiconductor Failure Analysis
• Electronic Packaging and Soldering Technologies
• Ferroelectric and Negative Capacitance Devices
• Silicon Carbide Semiconductor Technologies
• Electrostatic Discharge in Electronics

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Sources: OpenAlex, NLM Catalog, Crossref · Last verified 2026-09-06

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