Microelectronics and reliability

Published by Elsevier

United Kingdom · Semiconductor materials and devices

Journal at a glance

ISSN
0026-2714
Publisher
Elsevier
Country
United Kingdom
Language
en

Also known as: Microelectron Reliab (Abbreviation), Microelectronics reliability (Alternate title)

Metrics

MetricValueYearSource
DOIs registered (Crossref)307202026Crossref
DOIs, current year (Crossref)7752026Crossref
Works (OpenAlex)310872026OpenAlex
Citations (OpenAlex)2050512026OpenAlex
h-index (OpenAlex)1332026OpenAlex
i10-index (OpenAlex)51282026OpenAlex
2-year mean citedness (OpenAlex)2.5532026OpenAlex

Subjects

Similar journals

Sources: OpenAlex, NLM Catalog, Crossref · Last verified 2026-09-07

Journal homepage