Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
Published by Elsevier
Kingdom of the Netherlands · Ion-surface interactions and analysis
Journal at a glance
- ISSN
- 0168-583X
- Publisher
- Elsevier
- Country
- Kingdom of the Netherlands
- Language
- en
Also known as: Nucl Instrum Methods Phys Res B (Abbreviation), Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms (Alternate title), Nucl. instrum. methods phys. res., B, Beam interact. mater. atoms (Alternate title), Beam interactions with materials and atoms (Alternate title)
Metrics
| Metric | Value | Year | Source |
|---|
| h-index (OpenAlex) | 181 | 2026 | OpenAlex |
| DOIs registered (Crossref) | 38445 | 2026 | Crossref |
| DOIs, current year (Crossref) | 885 | 2026 | Crossref |
| Works (OpenAlex) | 42446 | 2026 | OpenAlex |
| Citations (OpenAlex) | 566634 | 2026 | OpenAlex |
| i10-index (OpenAlex) | 15883 | 2026 | OpenAlex |
| 2-year mean citedness (OpenAlex) | 1.685 | 2026 | OpenAlex |
Subjects
- Ion-surface interactions and analysis
- Nuclear Physics and Applications
- X-ray Spectroscopy and Fluorescence Analysis
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Atomic and Molecular Physics
- Semiconductor materials and devices
Similar journals
- Surface and interface analysis : SIA — United States · — · Same subject: Electron and X-Ray Spectroscopy Techniques, Same subject: Integrated Circuits and Semiconductor Failure Analysis, 5 shared subjects in total
- Journal of electron spectroscopy and related phenomena — Kingdom of the Netherlands · — · Same subject: Atomic and Molecular Physics, Same subject: Electron and X-Ray Spectroscopy Techniques, 4 shared subjects in total, Same country
- Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society — United States · — · Same subject: Electron and X-Ray Spectroscopy Techniques, Same subject: Ion-surface interactions and analysis, 3 shared subjects in total
- Radiation effects — United States · — · Same subject: Integrated Circuits and Semiconductor Failure Analysis, Same subject: Ion-surface interactions and analysis, 3 shared subjects in total
- Journal of electron microscopy — United Kingdom · — · Same subject: Electron and X-Ray Spectroscopy Techniques, Same subject: Integrated Circuits and Semiconductor Failure Analysis, 3 shared subjects in total
- Journal of surface analysis (Online) — Japan · Open access · Same subject: Electron and X-Ray Spectroscopy Techniques, Same subject: Ion-surface interactions and analysis, 3 shared subjects in total
Sources: OpenAlex, NLM Catalog, Crossref · Last verified 2026-09-07
Journal homepage