Ultramicroscopy
Published by Elsevier
Kingdom of the Netherlands · Electron and X-Ray Spectroscopy Techniques
Journal at a glance
- ISSN
- 0304-3991, 1879-2723 (electronic)
- Publisher
- Elsevier
- Country
- Kingdom of the Netherlands
- Language
- en
Indexing
- Medline: Active
- Pubmed: Active
Metrics
| Metric | Value | Year | Source |
|---|
| DOIs registered (Crossref) | 9746 | 2026 | Crossref |
| DOIs, current year (Crossref) | 358 | 2026 | Crossref |
| Works (OpenAlex) | 9788 | 2026 | OpenAlex |
| h-index (OpenAlex) | 179 | 2026 | OpenAlex |
| Citations (OpenAlex) | 246256 | 2026 | OpenAlex |
| i10-index (OpenAlex) | 4762 | 2026 | OpenAlex |
| 2-year mean citedness (OpenAlex) | 2.727 | 2026 | OpenAlex |
Subjects
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced X-ray Imaging Techniques
- Advanced Materials Characterization Techniques
- Surface and Thin Film Phenomena
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Sources: OpenAlex, NLM Catalog, Crossref · Last verified 2026-09-06
Journal homepage