ICCAD. IEEE/ACM International Conference on Computer-Aided Design
Published by IEEE
United States · VLSI and Analog Circuit Testing
Journal at a glance
- ISSN
- 1933-7760
- Publisher
- IEEE
- Country
- United States
- Language
- en
Also known as: ICCAD IEEE ACM Int Conf Comput Aided Des (Abbreviation), Proceedings of the ... IEEE/ACM International Conference on Computer-Aided Design (Alternate title), Proceedings of the ... International Conference on Computer-Aided Design (Alternate title), IEEE/ACM digest of technical papers (Alternate title), 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051) (Alternate title), IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002. (Alternate title), Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) (Alternate title), 1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287) (Alternate title), ICCAD -- IEEE/ACM International Conference on Computer-Aided Design/ICCAD (Alternate title)
Metrics
| Metric | Value | Year | Source |
|---|
| Works (OpenAlex) | 1497 | 2026 | OpenAlex |
| Citations (OpenAlex) | 19219 | 2026 | OpenAlex |
| h-index (OpenAlex) | 61 | 2026 | OpenAlex |
| i10-index (OpenAlex) | 448 | 2026 | OpenAlex |
| 2-year mean citedness (OpenAlex) | 0 | 2026 | OpenAlex |
Subjects
- VLSI and Analog Circuit Testing
- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
- Embedded Systems Design Techniques
- Parallel Computing and Optimization Techniques
- Interconnection Networks and Systems
- Integrated Circuits and Semiconductor Failure Analysis
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Sources: NLM Catalog, OpenAlex